AWANG, Z. .; GHODGAONKAR, D. K. .; BABA, N. H. . Free Space Microwave Characterization of Silicon Wafers for Microelectronic Applications. Scientific Research Journal, [S. l.], v. 2, n. 2, p. 35–47, 2005. DOI: 10.24191/srj.v2i2.9331. Disponível em: https://journal.uitm.edu.my/ojs/index.php/SRJ/article/view/3493. Acesso em: 5 nov. 2024.