Awang Z, Ghodgaonkar DK, Baba NH. Free Space Microwave Characterization of Silicon Wafers for Microelectronic Applications. SRJ [Internet]. 2005 Dec. 31 [cited 2024 Nov. 21];2(2):35-47. Available from: https://journal.uitm.edu.my/ojs/index.php/SRJ/article/view/3493